Transmission Electron Microscopy (TEM) – TalosF200X

Task: Microstructural characterization of novel Fe based structural materials for energy applications, e.g. ODS steels, and investigation of deformation processes   Specific information on the method: TEM point resolution: 0.25 nm Information limit: 0.12 nm TEM...

Helium Ion Microscopy (HIM)

Task: High resolution imaging of conductive and uncoated insulating sample surfaces, as well as high resolution materials modification and milling of nanostructures.   Specific information on the method: Lateral resolution: better than 0.4 nm (Helium, edge...