- 100 liter milling drum set up (CM100B)
- 3-D Atomprobe Tomography (APT)
- Ambient Pressure Photoelectron Spectroscopy (AP-XPS)
- Apparatus for in-situ Defect Analysis (AIDA)
- Cryogenic Impact Testing
- Cryo-Heatcapacity Physical Properties Measurement System (PPMS)
- Cryo X-ray Diffraction (Cryo-XRD)
- Field Emission Scanning Electron Microscope (FEG-SEM)
- Field Emission Scanning Electron Microscope combined with Focussed Ion Beam (FEG-SEM/FIB)
- Focussed Ion Beam (FIB)
- Hard X-Ray Photoelectron Emission Microscopy (HAX-PEEM)
- Helium Ion Microscopy (HIM)
- Hydrogen Tank Test Facility II (HTTF II)
- In-situ Synchrotron Radiation Powder X-ray Diffraction (in-situ SR-PXD)
- Juelich Online Silicon(Semiconductor) Growth Experiment for Photovoltaics (JOSEPH)
- Raman Microscope
- Secondary Ion Mass Spectrometry coupled to Tandem Accelerator (Super-SIMS)
- Transmission Electron Microscopy (TEM) – TalosF200X
- Transmission Electron Microscopy (TEM) – Titan G2 80-200 Crewely
